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Volumn 27, Issue 4, 2012, Pages

Electrical transport and depletion region in dry-etched Si-based nanostructures

Author keywords

[No Author keywords available]

Indexed keywords

DEPLETION REGION; DOPING LEVELS; DRY ETCHING PROCESS; ELECTRICAL CONDUCTION; ELECTRICAL TRANSPORT; I-V MEASUREMENTS; NANO-STRUCTURED; SI-BASED; SILICON-ON-INSULATORS;

EID: 84858393769     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/27/4/045016     Document Type: Article
Times cited : (1)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.