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Volumn 27, Issue 4, 2012, Pages
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Electrical transport and depletion region in dry-etched Si-based nanostructures
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Author keywords
[No Author keywords available]
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Indexed keywords
DEPLETION REGION;
DOPING LEVELS;
DRY ETCHING PROCESS;
ELECTRICAL CONDUCTION;
ELECTRICAL TRANSPORT;
I-V MEASUREMENTS;
NANO-STRUCTURED;
SI-BASED;
SILICON-ON-INSULATORS;
BORON;
PHOTONIC CRYSTALS;
NANOSTRUCTURES;
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EID: 84858393769
PISSN: 02681242
EISSN: 13616641
Source Type: Journal
DOI: 10.1088/0268-1242/27/4/045016 Document Type: Article |
Times cited : (1)
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References (21)
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