Analysis of near field microwave and conventional optical images

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8011, Issue , 2011, Pages

  López Maldonado, Guillermo ^a   Qureshi, Naser ^a   Vargas Hernández, Hesiquio ^a   Ordóñez Romero, César L ^a   Avendano Alejo M ^a   Kolokoltsev, Oleg V ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

capacitive coupling; high sensitivity; Near field microwave microscopy; reflection coefficient; resonant probe

Indexed keywords

CAPACITIVE COUPLINGS; HIGH SENSITIVITY; MICROELECTRONIC CIRCUITS; MICROWAVE IMAGES; MICROWAVE REFLECTION; NEAR FIELDS; NEAR-FIELD MICROWAVE MICROSCOPY; OPTICAL ANALYSIS; OPTICAL IMAGE; RESONANT PROBES;

GEOMETRICAL OPTICS; LIGHT; MICROELECTRONICS; PROBES; REFLECTION;

MICROWAVES;

EID: 84858379694     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.903423     Document Type: Conference Paper

References (9)

1. M. Tabib-Azar, J. L. Katz, and S. R. LeClair, IEEE Trans. Instrum. Meas. 48, 1111, (1999).
2. H. P. Kleinknecht, J. R. Sandercock, H. Meier, Scanning Microscopy 2, 1839 (1988).
3. M. Tabib-Azar, R. Ciocan, G. Ponchak, and S. R. LeClair, Rev. Sci. Instrum. 70, 3387, (1999).
4. M. Tabib-Azar, P. S. Pathak, G. Ponchak, and S. LeClair, Rev. Sci. Instrum. 70, 2783, (1999).
5. V. V. Talanov, L. V. Mercaldo, S. M. Anlage, and J. H. Claassen, Rev. Sci. Instrum.,71, 2136 (2000).
6. A. Tselev, S. M. Anlage, H. Christen, R. L. Moreland, V. V. Talanov, and A. R. Schwartz, Rev. Sci. Instrum. 74, 3167 (2003).
7. S. M. Anlage, D. E. Steinhauer, B. J. Feenstra, C. P. Vlahacos, and F. C. Wellstood, "Near-Field Microwave Microscopy of Materials Properties," in Microwave Superconductivity, ed. by H. Weinstock and M. Nisenoff, (Kluwer, Amsterdam, 2001),
8. M. Tabib-Azar, N. Shoemaker and S. Harris, Meas. Sci. Tech., 4, 583 (1993).
9. Steven M. Anlange, Vladimir V. Talanov, and Andrew R. Schwartz, Principles of Near Field Microwave Microscopy.