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European Physical Journal B

Volumn 75, Issue 1, 2010, Pages 5-13

Analysis of the electronic structure of ultrathin NiO/Ag(100) films

(2) Thomas, I O a Fortunelli, A a

a AREA DELLA RICERCA (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE CALCULATION; BULK PROPERTIES; CENTRAL LAYERS; DENSITY-FUNCTIONAL METHODS; INTERFACIAL LAYER; SENSITIVE PROPERTIES; SILVER SUBSTRATE; ULTRA-THIN;

ELECTRONIC STRUCTURE; NICKEL OXIDE; OXIDE FILMS; SILVER OXIDES; ULTRATHIN FILMS;

SILVER;

EID: 77952957224 PISSN: 14346028 EISSN: 14346036 Source Type: Journal
DOI: 10.1140/epjb/e2010-00018-5 Document Type: Article

Times cited : (16)

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