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Volumn 520, Issue 11, 2012, Pages 3865-3870
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Structural and microstructural characterization of Bi 2Te 3 films deposited by the close space vapor transport method using scanning electron microscopy and X-ray diffraction techniques
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Author keywords
Bismuth telluride; Close space vapor transport; Crystal microstructure; Texture; Thermoelectric properties; X ray diffraction
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Indexed keywords
BISMUTH TELLURIDE;
CLOSE SPACE VAPOR TRANSPORT;
MICRO-STRUCTURAL CHARACTERIZATION;
MICROSTRUCTURAL FEATURES;
SODA LIME GLASS SUBSTRATE;
STRUCTURAL AND ELECTRICAL PROPERTIES;
SUBSTRATE TEMPERATURE;
THERMOELECTRIC PROPERTIES;
VAPOR TRANSPORT;
VAPOR TRANSPORT METHODS;
X-RAY DIFFRACTION TECHNIQUES;
CRYSTAL MICROSTRUCTURE;
ELECTRIC PROPERTIES;
MICROSTRUCTURAL EVOLUTION;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
TEXTURES;
THERMOELECTRIC EQUIPMENT;
X RAY DIFFRACTION;
VAPORS;
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EID: 84858333721
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2012.01.023 Document Type: Article |
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Times cited : (8)
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References (16)
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