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Vacuum

Volumn 86, Issue 8, 2012, Pages 1092-1096

Impact of thickness on vacuum deposited PbSe thin films

(3) Arivazhagan, V a Manonmani Parvathi, M a Rajesh, S a

a KARUNYA UNIVERSITY (India)

Author keywords

Hall studies; Optical properties; PbSe thin films; Thickness; X ray diffraction

Indexed keywords

BLUE SHIFT; DIFFERENT THICKNESS; DISLOCATION DENSITIES; ELECTRICAL MOBILITY; EMISSION PEAKS; FREE CARRIERS; GLASS SUBSTRATES; GRAIN SIZE; HALL STUDIES; LEAD SELENIDE; MEAN FREE PATH; MICRO-STRAIN; ROCK SALT; ROOM TEMPERATURE PHOTOLUMINESCENCE SPECTRA; STRUCTURAL PARAMETER; STRUCTURAL STUDIES; THICKNESS; VACUUM EVAPORATION TECHNIQUE; VISIBLE REGION;

OPTICAL PROPERTIES; SUBSTRATES; THIN FILMS; VACUUM EVAPORATION; X RAY DIFFRACTION;

FILM PREPARATION;

EID: 84858158016 PISSN: 0042207X EISSN: None Source Type: Journal
DOI: 10.1016/j.vacuum.2011.10.008 Document Type: Article

Times cited : (56)

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