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Volumn 58, Issue 8-9 SPEC. ISS., 2007, Pages 794-799

Characterization of vacuum-evaporated ZnSe thin films

Author keywords

Composition; I V; Optical transmission; Structure; Thin films

Indexed keywords

FILM THICKNESS; LIGHT TRANSMISSION; OPTICAL PROPERTIES; VACUUM EVAPORATION; X RAY DIFFRACTION ANALYSIS; ZINC COMPOUNDS;

EID: 34250630024     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2006.11.017     Document Type: Article
Times cited : (50)

References (12)
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  • 3
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  • 5
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    • JCPDS, X-ray powder diffraction file, Joint Committee for Powder Diffraction.
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    • Structural characterization of vacuum evaporated ZnSe thin films
    • Kalita P.K.R., Sarma B.K., and Das H.C. Structural characterization of vacuum evaporated ZnSe thin films. Bull Mater Sci 23 4 (2000) 313-317
    • (2000) Bull Mater Sci , vol.23 , Issue.4 , pp. 313-317
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.