Fabrication of nanostructured ZnO thin film sensor for NO 2 monitoring

Ceramics International

Volumn 38, Issue 4, 2012, Pages 2685-2692

  Chougule, M A ^a   Sen, Shashwati ^b   Patil, V B ^a  

^a SOLAPUR UNIVERSITY   (India)

^b BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

AFM; HRTEM; NO 2 sensor; SEM; XRD; ZnO thin films

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPIES (AFM); GAS RESPONSE; GLASS SUBSTRATES; HEXAGONAL CRYSTAL STRUCTURE; HRTEM; NANO-STRUCTURED; NANOCRYSTALLINES; OPERATING TEMPERATURE; SCANNING ELECTRON MICROSCOPIES (SEM); SPIN-COATING METHOD; STRUCTURAL AND MORPHOLOGICAL PROPERTIES; XRD; ZINC OXIDE (ZNO); ZNO FILMS; ZNO THIN FILM;

ATOMIC FORCE MICROSCOPY; METALLIC FILMS; OPTICAL FILMS; SCANNING ELECTRON MICROSCOPY; SENSORS; SUBSTRATES; TEMPERATURE; X RAY DIFFRACTION; ZINC OXIDE;

NITROGEN OXIDES;

EID: 84858077104     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2011.11.036     Document Type: Article

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