Limitations on dynamic excess carrier lifetime calibration methods

Progress in Photovoltaics: Research and Applications

Volumn 20, Issue 2, 2012, Pages 246-249

  Sinton, Ronald A ^a   Trupke, Thorsten ^b  

^a Sinton Consulting Inc   (United States)

^b BT Imaging NSW   (Australia)

Author keywords

carrier lifetime; multicrystalline; photoluminescence; qsspc; silicon; wafer

Indexed keywords

BREAK DOWN; CALIBRATION CONSTANTS; CALIBRATION METHOD; CELL PRODUCTION; CRYSTALLINE SILICON WAFERS; EXPERIMENTAL ERRORS; MINORITY CARRIER LIFETIMES; MULTICRYSTALLINE; ON DYNAMICS; QSSPC; STEADY-STATE CONDITION; SURFACE RECOMBINATION VELOCITIES; TRANSIENT MODES; WAFER;

CALIBRATION; CARRIER LIFETIME; ERRORS; PHOTOLUMINESCENCE; SILICON;

SILICON WAFERS;

EID: 84857447206     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.1119     Document Type: Article

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