XPS-SIMS surface characterization of aluminovanadate oxide catalyst precursors: Effect of precipitation pH

Metallofizika i Noveishie Tekhnologii

Volumn 33, Issue 11, 2011, Pages 1487-1512

  Chenakin, S P ^a   Prada Silvy, R ^b   Kruse, N ^c  

^a INSTITUTE OF METAL PHYSICS   (Ukraine)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^c UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

Author keywords

Al 2O 3; Aluminovanadate oxide catalyst (V Al O); Auger parameter; Molecular secondary ions; Partial charge; TOF SIMS; V 2O 5; Valence band; Vanadium oxidation state; Wagner plot; XPS

Indexed keywords

EID: 84857069844     PISSN: 10241809     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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