TOF-SIMS characterization of an aluminovanadate oxide catalyst

Surface and Interface Analysis

Volumn 39, Issue 7, 2007, Pages 567-574

  Chenakin, S P ^a,c   Silvy, R Prada ^b   Kruse, N ^a  

^a UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^c INSTITUTE OF METAL PHYSICS   (Ukraine)

Author keywords

Molecular secondary ions; TOF SIMS; V2O5; Vanadium aluminium oxide catalysts; XPS

Indexed keywords

CATALYSTS; DEHYDROGENATION; HYDROXYLATION; PH EFFECTS; SECONDARY ION MASS SPECTROMETRY; VANADIUM COMPOUNDS;

ALUMINOVANADATE OXIDE CATALYSTS; MOLECULAR ION EMISSION; MOLECULAR SECONDARY IONS; TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS); VANADIUM OXIDE;

ALUMINUM COMPOUNDS;

EID: 34250747439     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2560     Document Type: Article

References (38)

1. Hopstaken MJP, Linke R, van Gennip WJH, Niemantsverdriet JW. Applications in catalysis. In ToF-SIMS: Surface Analysis by Mass Spectrometry, Vickerman JC, Briggs D (eds). IM Publications: Chichester, 2001; 697.
2. Takahashi N, Mori T, Furuta A, Komai S, Miyamoto A, Hattori T, Murakami Y. J. Catal. 1988; 110: 410.
3. Reiche MA, Hug P, Baiker A. J. Catal. 2000; 192:400.
4. Bond GC. Catal. Today 1994; 20: 125.
5. Weng LT, Bertrand P, Tirions O, Devillers M. Appl. Surf. Sci. 1996; 99: 185.
6. Rodrigo L, Adnot A, Roberge PC, Kaliaguine S. J. Catal. 1987; 105: 175.
7. Meijers ACQM, de Jong AM, van Gruijthuijsen LMP, Niemantsverdriet JW. Appl. Catal. 1991; 70: 53.
8. Grams J, Góralski J, Paryjczak T. Surf. Sci. 2004; 549: L21.
9. Sellmer C, Decker S, Kruse N. Catal. Lett. 1998; 52: 131.
10. van Hardeveld RM, Borg HJ, Niemantsverdriet JW. J. Mol. Catal. A 1998; 131: 199.
11. Wiame H, Bois L, L'haridon P, Laurent Y, Grange P. J. Eur. Ceram. Soc. 1997; 17: 2017.
12. Florea M, Prada Silvy R, Grange P. Catal. Lett. 2003; 87: 63.
13. Florea M, Prada Silvy R, Grange P. Appl. Catal., A 2003; 255: 289.
14. Blangenois N, Florea M, Grange P, Prada Silvy R, Chenakin SP, Bastin JM, Kruse N, Barbero BP, Cadús L. Appl. Catal., A 2004; 263: 163.
15. Chenakin SP, Prada Silvy R, Kruse N. Catal. Lett. 2005; 102: 39.
16. Cazaux J. J. Electron Spectrosc. Relat. Phenom. 1999; 105: 155.
17. Werner HW, Morgan AE. J. Appl. Phys. 1976; 47: 1232.
18. Morgan AE, Werner HW. J. Chem. Phys. 1978; 68: 3900.
19. Williams P. Surf. Sci. 1979; 90: 588.
20. Williams P. Appl. Surf. Sci. 1982; 13: 241.
21. Panichkin IYu, Chenakin SP. JETP 1995; 81: 367.
22. Gurvich LV, Karachevtsev GV, Kondrat'ev VN, Lebedev YuA, Medvedev VA, Potapov VK, Khodeyev YuS. Chemical Bond-Breaking Energies. Ionisation Potentials and Electron Affinities, Reference book. Nauka: Moscow, 1974; (in Russian).
23. Reddy RR, Ahammed YN, Gopal KR, Azeem PA, Rao TVR. J. Quant. Spectrosc. Radiat. Transf. 2000; 67: 85.
24. Harrington J, Weisshaar JC. J. Chem. Phys. 1992; 97: 2809.
25. Rao VM, Rao MLP, Rao PT. Phys. Rev., A 1982; 26: 1765.
26. Allendorf MD, Melius CF, Cosic B, Fontijn A. J. Phys. Chem. A 2002; 106: 2629.
27. Balducci G, Gigli G, Guidon M. J. Chem. Phys. 1983; 79: 5616.
28. Cobos CJ. J. Mol. Struct.: Theochem 2002; 581: 17.
29. Okajima Y. J. Appl. Phys. 1984; 55: 230.
30. Pivin JC, Roques-Carmes C, Slodzian G. Int. J. Mass Spectrom. Ion Phys. 1979; 31: 293.
31. Lipinsky D, Wiedmann L, Benninghoven A. In Secondary Ion Mass Spectrometry SIMS X, Benninghoven A, Hagenhoff B, Werner HW (eds). Wiley: Chichester, 1997; 235.
32. Panichkin IYu, Chenakin SP, Cherepin VT. Phys. Metals 1993; 13: 81.
33. Chenakin SP, Prada Silvy R, Kruse N. J. Phys. Chem. B 2005; 109: 14611.
34. Joyes P. J. Phys. 1983; 44: 221.
35. Plog C, Wiedmann L, Benninghoven A. Surf. Sci. 1977; 67: 565.
36. Aubriet F, Poleunis C, Bertrand P. J. Mass Spectrom. 2001; 36: 641.
37. Grzybowska-Świerkosz B. Appl. Catal. A 1997; 157: 409.
38. Harlin ME, Niemi VM, Krause AOI. J. Catal. 2000; 195: 67.