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Volumn 30, Issue 1, 2012, Pages

Fabrication of stable and reproducible submicron tunnel junctions

Author keywords

[No Author keywords available]

Indexed keywords

TUNNEL JUNCTIONS;

EID: 84856610838     PISSN: 21662746     EISSN: 21662754     Source Type: Journal    
DOI: 10.1116/1.3673790     Document Type: Article
Times cited : (81)

References (12)
  • 2
    • 34347334628 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.75.195441
    • J. R. Nesbitt and A. F. Hebard, Phys. Rev. B 75, 195441 (2007). 10.1103/PhysRevB.75.195441
    • (2007) Phys. Rev. B , vol.75 , pp. 195441
    • Nesbitt, J.R.1    Hebard, A.F.2
  • 4
    • 0021393312 scopus 로고
    • Critical current uniformity and stability of Nb/al-oxide-nb josephson junctions
    • DOI 10.1063/1.333235
    • J. V. Gates, M. A. Washington, and M. Gurvitch, J. Appl. Phys. 55, 1419 (1984). 10.1063/1.333235 (Pubitemid 14582342)
    • (1984) Journal of Applied Physics , vol.55 , Issue.5 , pp. 1419-1421
    • Gates, J.V.1    Washington, M.A.2    Gurvitch, M.3
  • 7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.