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Vacuum

Volumn 86, Issue 6, 2012, Pages 729-732

Nano-structuring of sputtered gold layers on glass by annealing

(5) Svorcik V a Kvitek O a Riha J b Kolska Z c Siegel, J a

a INSTITUTE OF CHEMICAL TECHNOLOGY (Czech Republic)

b UNIVERSITY OF WEST BOHEMIA (Czech Republic)

c J E PURKINJE UNIVERSITY (Czech Republic)

Author keywords

AFM; Glass; Gold; Sputtering; XRD

Indexed keywords

AFM; ANNEALED SAMPLES; CRYSTALLINE STRUCTURE; GLASS SUBSTRATES; GOLD LAYER; INCREASED TEMPERATURE; LATTICE STRESS; LAYER THICKNESS; MICRODEFORMATIONS; NANO-STRUCTURING; ROOM TEMPERATURE; SPUTTERING TIME; STRUCTURE RELAXATION; XRD; XRD ANALYSIS;

ANNEALING; CRYSTALLINE MATERIALS; CRYSTALLITE SIZE; DEFORMATION; GLASS; GOLD; MORPHOLOGY; NANOSTRUCTURES; SPUTTERING; SUBSTRATES; SURFACE ROUGHNESS;

SURFACE MORPHOLOGY;

EID: 84856550855 PISSN: 0042207X EISSN: None Source Type: Journal
DOI: 10.1016/j.vacuum.2011.07.040 Document Type: Conference Paper

Times cited : (11)

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