Properties of gold nanostructures sputtered on glass

Nanoscale Research Letters

Volumn 6, Issue 1, 2011, Pages

  Siegel, Jakub ^a   Lyutakov, Olexiy ^a   Rybka, Vladimír ^a   Kolská, Zdeňka ^b   Švorčík, Václav ^a  

^a INSTITUTE OF CHEMICAL TECHNOLOGY   (Czech Republic)

^b J E PURKINJE UNIVERSITY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; GLASS; GOLD; LATTICE CONSTANTS; METAL ANALYSIS; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; TEMPERATURE DISTRIBUTION; ANNEALING; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CHEMICAL ANALYSIS; GOLD DEPOSITS; POLYTETRAFLUOROETHYLENES; SURFACE MORPHOLOGY; SURFACE ROUGHNESS; X RAY PHOTOELECTRON SPECTROSCOPY; ZETA POTENTIAL; ELECTRIC PROPERTIES;

CRYSTALLINE STRUCTURE; DENSITY APPROACHES; DIRECT CURRENT SPUTTERING; EFFECTIVE THICKNESS; ELECTRICAL AND OPTICAL PROPERTIES; GOLD NANOSTRUCTURES; INCREASING FUNCTIONS; MEASURED TEMPERATURES; CARBON CONTAMINATION; CHEMICAL COMPOSITIONS; ELECTRICAL SHEET RESISTANCE; ELECTROKINETIC ANALYSIS; GOLD LAYER; GOLD NANOLAYERS; GOLD-COATED; OXIDIZED STRUCTURES; POST DEPOSITION ANNEALING; TWO-POINT; XPS SPECTRA; AU CLUSTERS; AU NANOSTRUCTURE; BULK VALUE; ISOLATED ISLANDS; LATTICE EXPANSION; LAYER THICKNESS; METAL DENSITY; SEM ANALYSIS; SOLID SURFACE; TEMPERATURE DEPENDENCE; THIN LAYERS;

NANOSTRUCTURES; GOLD COATINGS;

EID: 84255173441     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-6-96     Document Type: Article

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