Effect of oxygen pressure on the structural and magnetic properties of thin Zn 0.98Mn 0.02O films

EPJ Applied Physics

Volumn 57, Issue 1, 2012, Pages

  Khodorov, A ^a   Rolo, A G ^a   Hlil, E K ^b   Ayres De Campos, J ^a   Karzazi, O ^a,d   Levichev, S ^a   Correia, M R ^c   Chahboun, A ^a,e   Gomes, M J M ^a  

^a UNIVERSITY OF MINHO   (Portugal)

^b CNRS   (France)

^c UNIVERSITY OF AVEIRO   (Portugal)

^d LPS   (Morocco)

^e ABDELMALEK ESSAADI UNIVERSITY   (Morocco)

Author keywords

[No Author keywords available]

Indexed keywords

EFFECT OF OXYGEN; ELECTRONIC STRUCTURE CALCULATIONS; LASER DEPOSITIONS; MAGNETIC BEHAVIOR; MICRON SIZE; MN ATOMS; OXYGEN PRESSURE; PARTIAL OXYGEN PRESSURES; RAMAN TECHNIQUES; STRUCTURAL AND MAGNETIC PROPERTIES;

ELECTRONIC STRUCTURE; GLASS LASERS; HALL EFFECT; MAGNETIC MOMENTS; MAGNETIC PROPERTIES; MANGANESE; OXYGEN; PULSED LASER DEPOSITION; SUBSTRATES; X RAY DIFFRACTION; ZINC;

ELECTRIC PROPERTIES;

EID: 84856470907     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap/2011110380     Document Type: Article

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