Effect of oxygen atmosphere on the structure and refractive index dispersive behavior of KTa 0.5 Nb 0.5 O 3 thin films prepared by PLD on Si(0 0 1) substrates

Applied Surface Science

Volumn 258, Issue 8, 2012, Pages 3986-3990

  Yang, Wenlong ^a   Zhou, Zhongxiang ^a   Yang, Bin ^a   Jiang, Yongyuan ^a   Pei, Yanbo ^a   Sun, Hongguo ^a   Wang, Ying ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Cauchy dispersion model; Microtopography; Oxygen atmosphere; Refractive index dispersion

Indexed keywords

DISPERSION (WAVES); NIOBIUM COMPOUNDS; OXYGEN; PEROVSKITE; PHASE STRUCTURE; PULSED LASER DEPOSITION; REFRACTIVE INDEX; SILICON COMPOUNDS; SURFACE ROUGHNESS; TANTALUM COMPOUNDS;

CAUCHY DISPERSION MODELS; DISPERSION BEHAVIOR; DISPERSIVE BEHAVIORS; MICRO TOPOGRAPHY; NORMAL DISPERSION; OXYGEN ATMOSPHERE; PURE PEROVSKITE STRUCTURE; REFRACTIVE INDEX DISPERSION;

THIN FILMS;

EID: 84856216640     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.12.081     Document Type: Article

References (31)

1. W. Peng, M. Guilloux-Viry, S. Deputier, V. Bouquet, Q. Simon, A. Perrin, A. Dauscher, and S. Weber Appl. Surf. Sci. 254 2007 1298
2. A. Nazeri Appl. Phys. Lett. 65 1994 295
3. P.B. Ishai, C.E.M. de Oliveira, Y. Ryabov, Y. Feldman, and A.J. Agranat Phys. Rev. B 70 2004 132104
4. C. Kang, J.H. Park, D. Shen, H. Ahn, M. Park, and D.J. Kim J. Sol-Gel Technol. 58 2011 85
5. H.Y. Zhang, X.H. He, Y.H. Shih, K.S. Harshavardhan, and L.A. Knauss Opt. Lett. 22 1997 1745
6. Y.B. Jeon, R. Sood, J.-H. Jeong, and S.-G. Kim Sens. Actuator A-Phys. 122 2005 16
7. H. Simons, J. Daniels, W. Jo, R. Dittmer, A. Studer, M. Avdeev, J. Rödel, and M. Hoffman Appl. Phys. Lett. 98 2011 082901
8. T.H. Fang, W.J. Chang, C.M. Lin, L.W. Ji, Y.S. Chang, and Y.J. Hsiao Mater. Sci. Eng. A-Struct. 426 2006 157
9. O. Hirotaka, K. Akinori, and N. Yoshifumi J. Alloys Compd. 473 2009 567
10. W. Peng, V. Bouquet, S. Deputier, Q. Simon, M. Guilloux-Viry, and A. Perrin Integr. Ferroelectr. 93 2007 126
11. F.S. Chen, J.E. Geusic, S.K. Kurtz, J.G. Skinner, and S.H. Wemple J. Appl. Phys. 37 1966 388
12. S. Triebwasser Phys. Rev. 114 1959 63
13. X.P. Wang, J.Y. Wang, H.J. Zhang, Y.G. Yu, W.L. Gao, and R.I. Boughton J. Appl. Phys. 103 2008 033513
14. W.D. Ma, Z.S. Zhao, S.M. Wang, D.M. Zhang, D.S. Xu, X.D. Wang, and Z.J. Chen Phys. Status Solidi (a) 176 1999 985
15. S.R. Sashital, S. Krishnakumar, and S. Esener Appl. Phys. Lett. 62 1993 2917
16. C.J. Lu, and A.X. Kuang J. Mater. Sci. 32 1997 4421
17. S. Yilmaz, T. Venkatesan, and R. Gerhar-Multhaupt Appl. Phys. Lett. 58 1991 2479
18. J. Bursik, V. Zelezny, and P. Vanek J. Eur. Ceram. Soc. 25 2005 2151
19. K. Suzuki, W. Sakamoto, T. Yogo, and S. Hirano J. Am. Ceram. Soc. 82 1999 1463
20. A. Rousseau, M. Guilloux-Viry, E. Dogheche, M. Bensalah, and D. Remiens J. Appl. Phys. 102 2007 093106
21. A. Rousseau, V. Laur, S. Deputier, V. Bouquet, M. Guilloux-Viry, G. Tanne, P. Laurent, F. Huret, and A. Perrin Thin Solid Films 516 2008 4882
22. A.X. Kuang, C.J. Lu, G.Y. Huang, and S.M. Wang J. Cryst. Growth 149 1995 80
23. A. Onoe, A. Yoshida, and K. Chikuma Appl. Phys. Lett. 78 2001 49
24. B.M. Nichols, B.H. Hoerman, J.H. Hwang, T.O. Mason, and B.W. Wessels J. Mater. Res. 18 2003 106
25. X.L. Tong, K. Lin, D.J. Lv, M.H. Yang, Z.X. Liu, and D.S. Zhang Appl. Surf. Sci. 255 2009 7995
26. W.L. Yang, Z.X. Zhou, B. Yang, Y.Y. Jiang, H. Tian, D.W. Gong, H.G. Sun, and W. Chen Appl. Surf. Sci. 257 2011 7221
27. W.L. Yang, Z.X. Zhou, B. Yang, R. Zhang, Z. Wang, H.Z. Chen, and Y.Y. Jiang J. Am. Ceram. Soc. 94 2011 2493
28. C.R. Cho, and A. Grishin Appl. Phys. Lett. 75 1999 268
29. X.Z. Liu, S.M. He, D.H. Li, Q.F. Lu, Z.H. Wang, S.X. Bao, and Y.R. Li J. Mater. Sci. 40 2005 5139
30. A. Liu, J. Xue, X. Meng, J. Sun, Z. Huang, and J. Chu Appl. Surf. Sci. 254 2008 5660
31. S. Loheide, S. Riehemann, F. Mersch, R. Pankrath, and E. Kratzig Phys. Status Solidi (a) 137 1993 257