Structural and optical properties of ZnO thin films prepared by sol-gel method

Micro and Nano Letters

Volumn 6, Issue 9, 2011, Pages 767-769

  Khanlary, M R ^a   Isazadeh, S ^a  

^a IMAM KHOMEINI INTERNATIONAL UNIVERSITY   (Iran)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; ENERGY BANDGAPS; EXTINCTION COEFFICIENTS; GLASS SUBSTRATES; GRAIN SIZE; NANOSIZED GRAINS; OPTICAL SPECTROPHOTOMETERS; PHOTOVOLTAIC APPLICATIONS; STRUCTURAL AND OPTICAL PROPERTIES; WURTZITE STRUCTURE; X RAY DIFFRACTOMETERS; XRD PATTERNS; ZNO; ZNO THIN FILM;

ATOMIC FORCE MICROSCOPY; FILM PREPARATION; GELS; METEOROLOGICAL INSTRUMENTS; OXIDE FILMS; QUALITY CONTROL; REFRACTIVE INDEX; SOL-GEL PROCESS; SOL-GELS; SOLS; SPECTROPHOTOMETERS; SPECTROPHOTOMETRY; SUBSTRATES; THIN FILMS; ZINC OXIDE; ZINC SULFIDE;

OPTICAL FILMS;

NANOPARTICLE; ZINC OXIDE;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; ENERGY; FILM; GRAIN; OPTICS; PHYSICAL PHENOMENA; REFRACTION INDEX; SOL GEL METHOD; SPECTROPHOTOMETER; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

EID: 84856170735     PISSN: None     EISSN: 17500443     Source Type: Journal    
DOI: 10.1049/mnl.2011.0408     Document Type: Article

References (11)

1. Jeong, S., Lee, J., Lee, S., and Boo, J.: ' Deposition of aluminum-doped zinc oxide films by RF magnetron sputtering and study of their structural, electrical and optical properties ', Thin Solid Films, 2003, 435, p. 78-82 10.1016/S0040-6090(03)00376-6 0040-6090
2. Kim, H., Kim, J., and Kim, Y.: et al. ' Photo response of Si detector based on n-ZnO/p-Si and n-ZnO/n-Si structures ', Optical Materials, 2001, 17, p. 141-144 10.1016/S0925-3467(01)00037-4 (Pubitemid 32637131)
3. Huang, M., Maos, S., and Feick, H.: et al. ' Room-temperature ultraviolet nanowire nanolasers ', Science, 2001, 292, p. 1897-1899 10.1126/science.1060367 0036-8075 (Pubitemid 32538361)
4. Ghosh, R., Basak, D., and Fujihara, S.: ' Effect of substrate-induced strain on the structural, electrical, and optical properties of polycrystalline ZnO thin films ', J. Appl. Phys., 2004, 96, p. 2689-2692 10.1063/1.1769598 0021-8979
5. Jain, A., Sagar, P., and Mehra, R.M.: ' Changes of structural, optical and electrical properties of sol-gel derived ZnO films with their thichness ', Mater. Sci. Poland, 2007, 25, p. 233-242 (Pubitemid 46494187)
6. Yuonesi, M., Ghazi, M., Izadifard, M., and Yaghobi, M.: ' The optical and structural properties of ZnO:Mn nano films grown by sol-gel ', Optoelectron. Adv. Mater., 2008, 10, p. 2603-2606
7. Warren, B.: ' X-ray diffraction ', (Dover, New York, 1990), p. 253
8. Chambouleyron, I., Ventura, S., Birgin, E., and Martinez, J.: ' Optical constants and thickness determination of very thin amorphous semiconductor films ', J. Appl. Phys., 2002, 92, p. 3093-3102 10.1063/1.1500785 0021-8979 (Pubitemid 35209239)
9. Ozgur, U., Alivov, Y., and Liu, C.: et al. ' A comprehensive review of ZnO material and devices ', J. Appl. Phys., 2005, 98, p. 41301-41403 10.1063/1.1992666 0021-8979 (Pubitemid 41348664)
10. Wojcik, A., Kopalco, K., and Godlewski, M.: et al. ' Thin films of ZnO and ZnMnO by atomic layer epitaxy ', Optica Applicata, 2005, XXXV, (3), p. 413-417
11. Kumar, N., and Kaur, R.: ' Photoluminescence studies in sol-gel derived ZnO films ', Luminescence, 2007, 126, p. 784-788 10.1016/j.jlumin.2006.11.012 (Pubitemid 46755312)