ATR-FTIR Kretschmann spectroscopy for interfacial studies of a hidden aluminum surface coated with a silane film and epoxy I. Characterization by IRRAS and ATR-FTIR

Surface and Interface Analysis

Volumn 44, Issue 2, 2012, Pages 133-143

  Öhman, Maria ^a   Persson, Dan ^a  

^a SWEREA KIMAB   (Sweden)

Author keywords

aluminum; ATR FTIR Kretschmann; interface; IRRAS; organic coating; silane

Indexed keywords

ALUMINUM SURFACE; ANALYTICAL TECHNIQUES; ANALYTICAL TOOL; AREAS OF INTERESTS; ATR FTIR; ATR-FT-IR SPECTROSCOPY; COUNTERIONS; DATA INTERPRETATION; ENVIRONMENTALLY-FRIENDLY; EPOXY FILMS; INTERFACIAL ANALYSIS; INTERFACIAL STUDY; IRRAS; IRRAS SPECTROSCOPY; KRETSCHMANN GEOMETRY; METAL OXIDATION; METAL SURFACES; MODEL SYSTEM; OPTICAL DATA; PRE-TREATMENTS; SILANE FILMS; STRATIFIED MEDIA; THERMAL CURING; THIN METAL FILMS;

ALUMINUM; CURING; DATA PROCESSING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; METAL ANALYSIS; METALS; ORGANIC COATINGS; SILANES; SPECTRUM ANALYSIS;

INTERFACES (MATERIALS);

EID: 84856094787     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3779     Document Type: Article

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