SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 520, Issue 6, 2012, Pages 1988-1992

Nitric-phosphoric acid etching effects on the surface chemical composition of CdTe thin film

(6) Irfan, a Xia, Wei b Lin, Hao b Ding, Huanjun a Tang, Ching W a,b Gao, Yongli a,c

a UNIVERSITY OF ROCHESTER (United States)

b University of Rochester (United States)

c CENTRAL SOUTH UNIVERSITY (China)

Author keywords

Atomic force microscopy; Cadmium telluride; Depth profiling; Ion sputtering; Thin films; X ray photoelectron spectroscopy

Indexed keywords

ACID ETCHING; AMBIENT CONDITIONS; BACK CONTACT; CDTE; IN-DEPTH PROFILE; ION SPUTTERING; LOW RESISTANCE; METAL ELECTRODES; SURFACE CHEMICAL COMPOSITION; SURFACE DEGRADATION; XPS MEASUREMENTS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CADMIUM; CADMIUM COMPOUNDS; CADMIUM TELLURIDE; DEPTH PROFILING; ETCHING; PHOSPHORIC ACID; PHOTONS; PHOTOVOLTAIC CELLS; PHOTOVOLTAIC EFFECTS; SURFACE ROUGHNESS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

NITRIC ACID;

EID: 84855975584 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2011.08.113 Document Type: Article

Times cited : (6)

References (19)

1
- 0003132126
- X. Wu, J.C. Keane, R.G. Dhere, C. DeHart, D.S. Albin, A. Duda, T.A. Gessert, S. Asher, D.H. Levi, and P. Sheldon Proceedings of the 17th European PVSEC 2001 995
- (2001) Proceedings of the 17th European PVSEC , pp. 995
- Wu, X.¹ Keane, J.C.² Dhere, R.G.³ Dehart, C.⁴ Albin, D.S.⁵ Duda, A.⁶ Gessert, T.A.⁷ Asher, S.⁸ Levi, D.H.⁹ Sheldon, P.¹⁰

2
- 34247364375
- J. Sites, and J. Pan Thin Solid Films 515 2007 6099
- (2007) Thin Solid Films , vol.515 , pp. 6099
- Sites, J.¹ Pan, J.²

3
- 33745226995
- A.M. Acevedo Sol. Energy Mater. Sol. Cells 90 2006 2213
- (2006) Sol. Energy Mater. Sol. Cells , vol.90 , pp. 2213
- Acevedo, A.M.¹

4
- 3242671811
- S. Kim, Y.L. Soo, Y.H. Kao, and A.D. Compaan J. Appl. Phys. 96 2004 1007
- (2004) J. Appl. Phys. , vol.96 , pp. 1007
- Kim, S.¹ Soo, Y.L.² Kao, Y.H.³ Compaan, A.D.⁴

5
- 0001745652
- M.K. Hemdon, A. Gupta, V. Kaydanov, and R.T. Collins Appl. Phys. Lett. 75 1999 3503
- (1999) Appl. Phys. Lett. , vol.75 , pp. 3503
- Hemdon, M.K.¹ Gupta, A.² Kaydanov, V.³ Collins, R.T.⁴

6
- 0001190486
- Y. Yan, D. Albin, and M.M. Al-Jassim Appl. Phys. Lett. 78 2001 171
- (2001) Appl. Phys. Lett. , vol.78 , pp. 171
- Yan, Y.¹ Albin, D.² Al-Jassim, M.M.³

7
- 0141522625
- W.K. Metzger, D. Albin, D. Levi, P. Sheldon, X. Li, B.M. Keyes, and R.K. Ahrenkiel J. Appl. Phys. 94 2003 3549
- (2003) J. Appl. Phys. , vol.94 , pp. 3549
- Metzger, W.K.¹ Albin, D.² Levi, D.³ Sheldon, P.⁴ Li, X.⁵ Keyes, B.M.⁶ Ahrenkiel, R.K.⁷

8
- 0000517772
- X. Li, D.W. Niles, F.S. Hasoon, R.J. Matson, and P. Sheldon J. Vac. Sci. Technol., A 17 1999 805
- (1999) J. Vac. Sci. Technol., A , vol.17 , pp. 805
- Li, X.¹ Niles, D.W.² Hasoon, F.S.³ Matson, R.J.⁴ Sheldon, P.⁵

9
- 0029310089
- D.W. Niles, X. Li, and P. Sheldon J. Appl. Phys. 77 1995 4489
- (1995) J. Appl. Phys. , vol.77 , pp. 4489
- Niles, D.W.¹ Li, X.² Sheldon, P.³

10
- 56349154942
- R. Mendoza-Perez, J. Sastre-Hernandez, G. Contreras-Puente, and O. Vigil-Galan Sol. Energy Mater. Sol. Cells 93 2009 79
- (2009) Sol. Energy Mater. Sol. Cells , vol.93 , pp. 79
- Mendoza-Perez, R.¹ Sastre-Hernandez, J.² Contreras-Puente, G.³ Vigil-Galan, O.⁴

11
- 58949096653
- M. Hadrich, C. Kraft, C. Loffler, H. Metzner, U. Reislohner, and W. Witthuhn Thin Solid Films 517 2009 2282
- (2009) Thin Solid Films , vol.517 , pp. 2282
- Hadrich, M.¹ Kraft, C.² Loffler, C.³ Metzner, H.⁴ Reislohner, U.⁵ Witthuhn, W.⁶

12
- 0033881583
- N. Romeo, A. Bosio, P. Tedeschi, and V. Canevari Thin Solid Films 361 2000 327
- (2000) Thin Solid Films , vol.361 , pp. 327
- Romeo, N.¹ Bosio, A.² Tedeschi, P.³ Canevari, V.⁴

13
- 33846271087
- Y.Y. Proskuryakov, K. Durose, B.M. Taele, G.P. Welch, and S. Oelting J. Appl. Phys. 101 2007 014505
- (2007) J. Appl. Phys. , vol.101 , pp. 014505
- Proskuryakov, Y.Y.¹ Durose, K.² Taele, B.M.³ Welch, G.P.⁴ Oelting, S.⁵

14
- 9944255702
- Y. Yan, K.M. Jones, X. Wu, and M.M. Al-Jassim Thin Solid Films 472 2005 291
- (2005) Thin Solid Films , vol.472 , pp. 291
- Yan, Y.¹ Jones, K.M.² Wu, X.³ Al-Jassim, M.M.⁴

15
- 0030086595
- Z.C. Feng, H.C. Chou, A. Rohatgi, G.K. Lim, A.T.S. Wee, and K.L. Tan J. Appl. Phys. 79 1996 2151
- (1996) J. Appl. Phys. , vol.79 , pp. 2151
- Feng, Z.C.¹ Chou, H.C.² Rohatgi, A.³ Lim, G.K.⁴ Wee, A.T.S.⁵ Tan, K.L.⁶

16
- 0003459529
- Perkin-Elmer Corp.
- C.D. Wagner, W.M. Riggs, L.E. Davis, J.F. Moulder, and G.E. Muilenberg Handbook of X-Ray Photoelectron Spectroscopy 1979 Perkin-Elmer Corp.
- (1979) Handbook of X-Ray Photoelectron Spectroscopy
- Wagner, C.D.¹ Riggs, W.M.² Davis, L.E.³ Moulder, J.F.⁴ Muilenberg, G.E.⁵

17
- 0005904037
- D. Grecu, and A.D. Compaan J. Appl. Phys. 87 2000 1722
- (2000) J. Appl. Phys. , vol.87 , pp. 1722
- Grecu, D.¹ Compaan, A.D.²

18
- 0035967554
- D.L. Batzner, A. Romeo, H. Zogg, R. Wendt, and A.N. Tiwari Thin Solid Films 387 2001 151
- (2001) Thin Solid Films , vol.387 , pp. 151
- Batzner, D.L.¹ Romeo, A.² Zogg, H.³ Wendt, R.⁴ Tiwari, A.N.⁵

19
- 84855933910
- B3.1
- K.D. Dobson, P.D. Paulson, B.E. McCandless, and R.W. Birkmire Mater. Res. Soc. Symp. Proc. B3.1 2003 763
- (2003) Mater. Res. Soc. Symp. Proc. , pp. 763
- Dobson, K.D.¹ Paulson, P.D.² McCandless, B.E.³ Birkmire, R.W.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.