Migration of Te atoms and structural changes in CdS/CdTe heterojuctions studied by x-ray scattering and fluorescence

Journal of Applied Physics

Volumn 96, Issue 2, 2004, Pages 1007-1012

  Kim, S ^a   Soo, Y L ^a   Kioseoglou, G ^a   Kao, Y H ^a   Compaan, A D ^b  

^a UNIVERSITY AT BUFFALO   (United States)

^b UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DEPENDENCE OF X-RAY FLUORESCENCE (ADXRF); LOW SPATIAL RESOLUTIONS; OPTICAL CONSTANTS; X-RAY REFLECTION;

CHEMICAL ANALYSIS; DATA ACQUISITION; FLUORESCENCE; GLASS; PARAMETER ESTIMATION; RAPID THERMAL ANNEALING; REDUCTION; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING TELLURIUM; SOLAR CELLS; SURFACE ROUGHNESS; X RAY SCATTERING;

HETEROJUNCTIONS;

EID: 3242671811     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1755852     Document Type: Article

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