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Volumn 111, Issue 1, 2012, Pages

Probing origin of room temperature ferromagnetism in Ni ion implanted ZnO films with x-ray absorption spectroscopy

(11) Srivastava, P a Ghosh, S a Joshi, B b Satyarthi, P a Kumar, P c Kanjilal, D c Buerger, D d Zhou, S d Schmidt, H d Rogalev, A e Wilhelm, F e

a INDIAN INSTITUTE OF TECHNOLOGY DELHI (India)

b GAUTAM BUDDHA UNIVERSITY (India)

c INTER UNIVERSITY ACCELERATOR CENTRE (India)

d INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH (Germany)

e EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

Author keywords

[No Author keywords available]

Indexed keywords

FERROMAGNETIC MATERIALS; FERROMAGNETISM; II-VI SEMICONDUCTORS; ION IMPLANTATION; IONS; MAGNETOMETRY; OXYGEN VACANCIES; POLARONS; SATURATION MAGNETIZATION; X RAY ABSORPTION SPECTROSCOPY; ZINC OXIDE;

BOUND MAGNETIC POLARONS; FIELD COOLED; ION IMPLANTED; NI FILMS; ROOM TEMPERATURE FERROMAGNETISM; SQUID MAGNETOMETRY; ZERO FIELD COOLED MEASUREMENTS; ZNO FILMS;

NICKEL;

EID: 84855932248 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3676260 Document Type: Article

Times cited : (23)

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