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Volumn 28, Issue 2, 2012, Pages 197-203
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Atomic force microscopy nanoindentation of a dental restorative midifill composite
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Author keywords
Atomic force microscopy; Dental material; Elastic modulus; Hardness; Microanalysis; Midifill; Nanoindentation; Resin composite; Scanning electron microscopy
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Indexed keywords
COMPOSITIONAL UNIFORMITY;
DENTAL RESTORATIONS;
ELASTIC PROPERTIES;
ENERGY DISPERSIVE X-RAY;
FILLER PARTICLES;
HARDNESS VALUES;
HIGH RESOLUTION;
INDENTERS;
MICRO INDENTATION;
MICROSCOPIC STRUCTURES;
MIDIFILL;
NANOINDENTATION EXPERIMENTS;
QUANTITATIVE EVALUATION;
REDUCED MODULUS;
RESIN COMPOSITE;
RESIN COMPOSITES;
SCANNING ELECTRONS;
SPATIAL RESOLUTION;
SUBMICROMETERS;
TWO DIMENSIONAL MAPPING;
DENTAL MATERIALS;
ELASTIC MODULI;
ELASTICITY;
EXPERIMENTS;
FILLING;
HARDNESS;
MICROANALYSIS;
NANOINDENTATION;
RESINS;
SCANNING ELECTRON MICROSCOPY;
ATOMIC FORCE MICROSCOPY;
BARIUM DERIVATIVE;
BARIUM GLASS FILLER;
BIOMEDICAL AND DENTAL MATERIALS;
DIAMOND;
INORGANIC COMPOUND;
NANOCOMPOSITE;
RESIN;
SILICON CARBIDE;
SILICON DERIVATIVE;
SILICON DIOXIDE;
VENUS (COMPOSITE RESIN);
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMISTRY;
ELASTICITY;
HARDNESS;
HUMAN;
MATERIALS TESTING;
SCANNING ELECTRON MICROSCOPY;
SPECTROMETRY;
SURFACE PROPERTY;
TOOTH BRUSHING;
YOUNG MODULUS;
BARIUM COMPOUNDS;
CARBON COMPOUNDS, INORGANIC;
COMPOSITE RESINS;
DENTAL MATERIALS;
DENTAL POLISHING;
DIAMOND;
ELASTIC MODULUS;
ELASTICITY;
HARDNESS;
HUMANS;
MATERIALS TESTING;
MICROSCOPY, ATOMIC FORCE;
MICROSCOPY, ELECTRON, SCANNING;
NANOCOMPOSITES;
SILICON COMPOUNDS;
SILICON DIOXIDE;
SPECTROMETRY, X-RAY EMISSION;
SURFACE PROPERTIES;
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EID: 84855786684
PISSN: 01095641
EISSN: None
Source Type: Journal
DOI: 10.1016/j.dental.2011.10.007 Document Type: Article |
Times cited : (18)
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References (16)
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