Size-strain study of NiO nanoparticles by X-ray powder diffraction line broadening

Materials Letters

Volumn 72, Issue , 2012, Pages 36-38

  Goncalves N S ^a,b   Carvalho, J A ^a   Lima, Z M ^a   Sasaki, J M ^a  

^a FEDERAL UNIVERSITY OF CEARÁ   (Brazil)

^b INSTITUTO FEDERAL DE EDUCAÇÃO   (Brazil)

Author keywords

Microstructure; Nanoparticles; X ray techniques

Indexed keywords

DIFFRACTION PEAKS; LINE BROADENING; MICRO-STRAIN; NANOPARTICLE SIZES; NIO NANOPARTICLES; PERFECT CRYSTALS; SCHERRER EQUATIONS; WILLIAMSON-HALL; X-RAY POWDER; X-RAY TECHNIQUES;

DIFFRACTION; MICROSTRUCTURE; X RAY POWDER DIFFRACTION; X RAYS;

NANOPARTICLES;

EID: 84855770519     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2011.12.046     Document Type: Article

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