Development of a graphical interface for the Rietveld refinement program DBWS

Journal of Applied Crystallography

Volumn 33, Issue 4, 2000, Pages 1189-

  Bleicher, Lucas ^a   Sasaki, José Marcos ^a   Santos, Carlos Oliveira Paiva ^b  

^a FEDERAL UNIVERSITY OF CEARÁ   (Brazil)

^b SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

Author keywords

Graphical interface; Rietveld refinement program

Indexed keywords

EID: 19944397899     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800005410     Document Type: Article

References (3)

1. Marciniak, H. (1997). DMPLOT. Plot View Program for Rietveld Refinement Method. Version 3.48 October 1997. E-mail: marcin@waw.unipress.pl.
2. Young, R. A., Larson, A. C. & Paiva-Santos, C. O. (1999). User's Guide to Program DBWS-9807a for Rietveld Analysis of X-ray and Neutron Powder Diffraction Patterns. School of Physics, Georgia Institute of Technology, Atlanta GA, USA.
3. Young, R. A., Sakthivel, A., Moss, T. S. & Paiva-Santos, C. O. (1995). J. Appl. Cryst. 28, 366-367.