Structural variability in La 0.5Sr 0.5TiO 3±δ thin films

Applied Physics Letters

Volumn 99, Issue 26, 2011, Pages

  Gu, Meng ^a   Dearden, Craig R ^a   Song, Chengyu ^b   Browning, Nigel D ^a,c   Takamura, Yayoi ^a  

^a University of California Davis   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATION VACANCIES; FILM PROPERTIES; LOW RESISTIVITY; ORDERS OF MAGNITUDE; OXYGEN-RICH ENVIRONMENT; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SINGLE PHASE FILM; STRUCTURAL ORDERS; STRUCTURAL VARIABILITY; TIO; VALENCE STATE;

OXYGEN; PULSED LASER DEPOSITION; STACKING FAULTS; SUPERLATTICES; TRANSMISSION ELECTRON MICROSCOPY;

OXYGEN VACANCIES;

EID: 84855658898     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3672217     Document Type: Article

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