Parameters variability effects on multiconductor interconnects via hermite polynomial chaos

IEEE Transactions on Components, Packaging and Manufacturing Technology

Volumn 1, Issue 8, 2011, Pages 1234-1239

  Stievano, Igor Simone ^a   Manfredi, Paolo ^a   Canavero, Flavio G ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Circuit modeling; circuit simulation; polynomial chaos; stochastic analysis; tolerance analysis; transmission lines; uncertainty

Indexed keywords

CIRCUIT MODELING; POLYNOMIAL CHAOS; STOCHASTIC ANALYSIS; TOLERANCE ANALYSIS; UNCERTAINTY;

CIRCUIT SIMULATION; ELECTRIC LINES; FITS AND TOLERANCES; FREQUENCY DOMAIN ANALYSIS; STOCHASTIC MODELS; STOCHASTIC SYSTEMS; TELEGRAPH; UNCERTAINTY ANALYSIS;

POLYNOMIALS;

EID: 84855366652     PISSN: 21563950     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCPMT.2011.2152403     Document Type: Article

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