Scanning IQE-measurement for accurate current determination on very large area solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 454-457

  Fischer, B ^a   Keil, M ^a   Fath, P ^a   Bucher, E ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC VARIABLES MEASUREMENT; MASKS; QUANTUM EFFICIENCY; REFLECTION; SIGNAL TO NOISE RATIO;

INTEGRAL REFLECTANCE; SCALING ERRORS; SIGNAL TO BIAS RATIO;

SOLAR CELLS;

EID: 0036957004     PISSN: 01608371     EISSN: None     Source Type: Journal    
DOI: 10.1109/PVSC.2002.1190557     Document Type: Article

References (13)

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