Thickness independent magneto-optical coupling constant of nickel films in the visible spectral range

Journal of Applied Physics

Volumn 110, Issue 12, 2011, Pages

  Mok, K ^a   Scarlat, C ^a   Kovcs, G J ^a   Li, L ^b   Zviagin, V ^a   McCord, J ^c   Helm, M ^a   Schmidt, H ^a  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b PEKING UNIVERSITY   (China)

^c UNIVERSITY OF KIEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC TENSORS; GENERALIZED ELLIPSOMETRY; INCIDENT ANGLES; KERR ANGLE; LAYERED SAMPLE; MAGNETIZATION DIRECTION; MAGNETO-OPTICAL; MAGNETO-OPTICAL COUPLING; MAGNETOOPTICAL PROPERTIES; MUELLER MATRIX; MUELLER MATRIX ELEMENTS; MUELLER MATRIX ELLIPSOMETRY; NI FILMS; NI THIN FILMS; NICKEL FILM; ROOM TEMPERATURE; SAMPLE SURFACE; SATURATED MAGNETIZATION; SPECTRAL RANGE; VISIBLE SPECTRAL RANGE;

ELLIPSOMETRY; MAGNETIC FIELDS; MAGNETIZATION; MAGNETOS;

OPTICAL PROPERTIES;

EID: 84855312606     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3672834     Document Type: Article

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