Enhanced resolution of microscopic objects by image inversion interferometry

Optics Express

Volumn 19, Issue 27, 2011, Pages 26451-26462

  Weigel, D ^a   Foerster, R ^a   Babovsky, H ^a   Kiessling, A ^a   Kowarschik, R ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CUTOFF FREQUENCY; MICROSCOPES; OPTICAL TRANSFER FUNCTION;

ENHANCED RESOLUTIONS; IMAGE INVERSIONS; INTERFEROMETRIC SYSTEM; MICROSCOPIC OBJECTS; SPATIAL FREQUENCY; TRANSMISSION FUNCTION; TWO-DIMENSIONAL STRUCTURES; WIDE FIELD;

INTERFEROMETRY;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INSTRUMENTATION; INTERFEROMETRY; MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; INTERFEROMETRY; MICROSCOPY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 84555218602     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.026451     Document Type: Article

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