Investigation of the impulse response of an image inversion interferometer

Optics Communications

Volumn 283, Issue 3, 2010, Pages 368-372

  Weigel, D ^a   Babovsky, H ^a   Kiessling, A ^a   Kowarschik, R ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

Image detection systems; Interference microscopy; Microscopy; Resolution; Scanning microscopy

Indexed keywords

CLASSICAL SYSTEMS; CONFOCAL MICROSCOPES; EXPERIMENTAL DATA; FREQUENCY TRANSFER; IMAGE DETECTION; IMAGE INVERSIONS; INTERFERENCE MICROSCOPY; RESOLUTION IMPROVEMENT; RESOLUTION SCANNING; THEORETICAL VALUES; WIDE FIELD;

IMPULSE RESPONSE; INTERFEROMETERS;

INTERFEROMETRY;

EID: 70549111145     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2009.10.013     Document Type: Article

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