Visualization of multipolar longitudinal and transversal surface plasmon modes in nanowire dimers

ACS Nano

Volumn 5, Issue 12, 2011, Pages 9845-9853

  Alber, Ina ^a   Sigle, Wilfried ^b   Müller, Sven ^a   Neumann, Reinhard ^a   Picht, Oliver ^a   Rauber, Markus ^a,c   Van Aken, Peter A ^b   Toimil Molares, Maria Eugenia ^a  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^c DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

antibonding multipol order modes; bonding multipol order modes; electron energy loss spectroscopy; longitudinal surface plasmon resonances; nanowire dimer synthesis; transversal surface plasmon resonance

Indexed keywords

ANTIBONDING; BONDING MODES; GAP SIZE; HIGH-RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY; LOCALIZED SURFACE PLASMON RESONANCE; LONGITUDINAL MODES; METALLIC NANOWIRES; MODE SPLITTING; SINGLE NANOWIRES; SURFACE PLASMON MODES; SURFACE PLASMONS; THIRD ORDER; TRANSMISSION ELECTRON MICROSCOPE; TRANSVERSAL MODES; TRAVELING ELECTRONS;

ASPECT RATIO; DIMERS; DISSOCIATION; ELECTRIC FIELDS; ELECTRON BEAMS; ELECTRON SCATTERING; ELECTRONS; NANOWIRES; PLASMONS; SURFACE PLASMON RESONANCE; TRANSMISSION ELECTRON MICROSCOPY; VISUALIZATION;

ELECTRON ENERGY LOSS SPECTROSCOPY;

NANOMATERIAL;

ARTICLE; CHEMISTRY; DIMERIZATION; LIGHT; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; PHOTOMETRY; RADIATION SCATTERING; SURFACE PLASMON RESONANCE; ULTRASTRUCTURE;

DIMERIZATION; LIGHT; MATERIALS TESTING; NANOSTRUCTURES; PARTICLE SIZE; PHOTOMETRY; SCATTERING, RADIATION; SURFACE PLASMON RESONANCE;

EID: 84555177319     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn2035044     Document Type: Article

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