New FIB/TEM evidence for a REDR mechanism in sudden failures of 980 nm SL SQW InGaAs/AlGaAs pump laser diodes

Microelectronics Reliability

Volumn 40, Issue 8-10, 2000, Pages 1753-1757

  Vanzi, M ^a   Salmini, G ^b   De Palo, R ^b  

^a UNIVERSITY OF CAGLIARI   (Italy)

^b Shimadzu Italia srl   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 8444245278     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(00)00192-X     Document Type: Article

References (7)

1. F.Magistrali, M.Maini, G.Salmini and M.Vanzi: "Analysis of 980 nm SL SQW InGaAs pump laser degradations", Proc.21th International Symposium for Testing and Failure Analysis ISTFA/95, Santa Clara, California, November 1995, pp.171-176.
2. M.Vanzi, A.Bonfiglio, F.Magistrali, G.Salmini: "Electron Microscopy of life-tested semiconductor laser diodes". Micron 31 (2000) pp.259-267.
3. A.Bonfiglio, M.B.Casu, M.Vanzi, R.DePalo, F.Magistrali, G.Salmini: "Early signatures for REDR-based laser degradation". Microel.Reliab. 38 (1998) pp.1215-1220.
4. L.C.Kymerling: "Recombination Enhanced Defect Reactions"'. Solid State Electronics, Vol.21, pp. 1391-1401, 1978.
5. A Bonfiglio, M.B.Casu , M.Vanzi F.Magistrali, M.Maini, G.Salmini: "Interpretation of sudden failures in pump laser diodes", Proc.23rd International Symposium for Testing and Failure Analysis ISTFA97, Santa Clara, California, October 1997, pp. 189-194.
6. C.Donolato: "A reciprocity theorem for charge collection", Appl.Phys.Lett. 46(3), IFebr. 1985.
7. F.Magistrali, G.Salmini, G.Marlines and M.Vanzi: "Charge Diffusion and Reciprocity Thorems: a direct approach to EBIC of Ridge Laser Diodes". Proc. 22th International Symposium for Testing and Failure Analysis ISTFA96, Los Angeles, California, November 1996. pp. 233-238.