Charge Diffusion and Reciprocity Theorems: A Direct Approach to EBIC of Ridge Laser Diodes

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 1996-November, Issue , 1996, Pages 233-238

  Magistrali, F ^a   Salmini, G ^a   Marlines, G ^b   Vanzi, M ^b  

^a Pirelli Labs SpA   (Italy)

^b UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER DISTRIBUTIONS; CHARGE DIFFUSION; DIRECT APPROACH; LASER FACETS; MINORITY CARRIER; OPERATING CONDITION; RECIPROCITY THEOREM; RIDGE LASER; RIDGE STRUCTURES; TOP VIEWS;

FAILURE ANALYSIS;

EID: 84886886519     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.31399/asm.cp.istfa1996p0233     Document Type: Conference Paper

References (5)

1. F.Magistrali, M.Maini, G.Salmini and M.Vanzi: "Analysis of 980 nm SL SQW InGaAs pump laser degradations", Proc.21th International Symposium for Testing and Failure Analysis ISTFA/95, Santa Clara, California, Novembre 1995, pp. 171-176.
2. C.Donolato: "A reciprocity theorem for charge collection". Appl.Phys.Lett. 46(3), lFebr. 1985.
3. M.Vanzi, M.Giansante, L.Zazzetti, F.Magistrali, D.Sala, G.Salmini and F.Fantini: "Interpretation of Failure Analysis Results on ESD-Damaged InP Laser Diodes". Proc.l7th International Symposium for Testing and Failure Analysis ISTFA/91, Los Angeles, Novembre 1991, pp.305-314.
4. F.Magistrali, D.Sala, M.Vanzi and L.Battistella: "Failure analysis of GaAs/GaAlAs laser diodes'V.Proc. of the International Symposium on Testing and Failure Analysis ISTFA/90, Los Angeles. pp291-299.
5. C.Donolato: "An alternative proof of the generalized reciprocity theorem for charge collection". J.AppLPhys. 66(9), 1 Nov. 1989.