Structure characterization of MBE-grown (Zn,Cr)Se layers

Journal of Alloys and Compounds

Volumn 382, Issue 1-2, 2004, Pages 92-99

  Jouanne, M ^a   Morhange, J F ^a   Dynowska, E ^b   Lusakowska E ^b   Szuszkiewicz, W ^b   Molenkamp, L W ^c   Karczewski, G ^b,c  

^a SORBONNE UNIVERSITÉ   (France)

^b INSTITUTE OF PHYSICS   (Poland)

^c UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

(Zn,Cr)Se; Atomic force microscopy; Diluted magnetic semiconductors; Inelastic light scattering; Nanofabrications; Thin films; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; LIGHT SCATTERING; MAGNETIC SEMICONDUCTORS; NANOTECHNOLOGY; PRECIPITATION (CHEMICAL); X RAY DIFFRACTION; ZINC;

(ZN,CR)SE; DILUTED MAGNETIC SEMICONDUCTORS; INELASTIC LIGHT SCATTERING;

MOLECULAR BEAM EPITAXY;

EID: 8444240857     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.05.039     Document Type: Conference Paper

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