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Volumn 3, Issue 11, 2011, Pages 2644-2650

Evaluation of analytical reflection scanometry as an analytical tool

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL TOOL; APPLICATION RANGE; CONFIDENCE LEVELS; DIGITAL IMAGE; DOTS PER INCHES; FLATBED SCANNERS; MEASUREMENT SYSTEM; OPTICAL SCANNERS; QUANTITATIVE INFORMATION; REFLECTION MODES; SCANNING CONDITIONS; STATISTICAL DIFFERENCES; STATISTICAL EVALUATION; STATISTICAL STUDY; TEST ZONE; WATER SAMPLES;

EID: 84255193431     PISSN: 17599660     EISSN: 17599679     Source Type: Journal    
DOI: 10.1039/c1ay05341h     Document Type: Article
Times cited : (6)

References (52)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.