X-ray diffraction from nonperiodic layered structures with correlations: Analytical calculation and experiment on mixed Aurivillius films

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 68, Issue 1, 2012, Pages 148-155

  Kopp, V S ^a   Kaganer, V M ^a   Schwarzkopf, J ^b   Waidick, F ^b   Remmele, T ^b   Kwasniewski, A ^b   Schmidbauer, M ^b  

^a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

^b LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

Author keywords

Aurivillius structure; Markov chains; nonperiodic layers; X ray diffraction

Indexed keywords

BISMUTH; BISMUTH OXIDE; BISMUTH TITANATE; TITANIUM;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMICAL STRUCTURE; CHEMISTRY; X RAY CRYSTALLOGRAPHY;

BISMUTH; CRYSTALLOGRAPHY, X-RAY; MEMBRANES, ARTIFICIAL; MODELS, MOLECULAR; MOLECULAR STRUCTURE; TITANIUM;

EID: 84255182337     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S0108767311044874     Document Type: Article

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