SCOPUS 정보 검색 플랫폼

Volumn 14, Issue 12, 2011, Pages

X-ray photoelectron spectroscopy investigation of the Schottky barrier at a-BN:HCu interfaces

Author keywords

[No Author keywords available]

Indexed keywords

CU DIFFUSION BARRIER; CU SUBSTRATE; CU-INTERCONNECTS; ELECTRICAL LEAKAGE; HIGH DENSITY; LOW DIELECTRIC CONSTANTS; SCHOTTKY BARRIERS; TWO-MATERIALS;

BORON; CHEMICAL VAPOR DEPOSITION; INTERFACES (MATERIALS); NITRIDES; PHOTONS; SCHOTTKY BARRIER DIODES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84255167787 PISSN: 10990062 EISSN: None Source Type: Journal
DOI: 10.1149/2.015112esl Document Type: Article

Times cited : (26)

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