Discharge diagnosis of metal-enclosed switchgear by using TEV method

Gaodianya Jishu/High Voltage Engineering

Volumn 37, Issue 11, 2011, Pages 2672-2679

  Ren, Ming ^a   Dong, Ming ^a   Ren, Zhong ^a   Peng, Hua Dong ^a   Li, Hong Jie ^a   Qiu, Ai Ci ^a,b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b NORTHWEST INSTITUTE OF NUCLEAR TECHNOLOGY   (China)

Author keywords

Identification of defects; Metal enclosed switchgear; PD detection; Transient earth voltage(TEV)

Indexed keywords

DISCHARGE DIAGNOSIS; PULSE CURRENT METHOD; SWITCH GEARS; TEMPORAL PHASE;

DEFECTS; ELECTRIC SWITCHGEAR;

POWER QUALITY;

EID: 84155193817     PISSN: 10036520     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (17)

1. TIAN Yong, TIAN Jing-lin. The statistics and analysis of faults happened in 6~10 kV switchgears[J]. Northeast Electric Power Technology, 1996(8): 5-10.
2. Birlasekaran S, Weng Hoe Leong. Comparison of known PD signals with the developed and commercial HFCT sensors[J]. IEEE Transactions on Power Delivery, 2007, 22(3): 1581-1590.
3. ZHAO Xiao-hui, YANG Jing-gang, LU Xiu-li, et al. Comparative research on current pulse method and UHF measurements of partial discharge in mineral oil[J]. High Voltage Engineering, 2008, 34(7): 1401-1404.
4. Tenbohlen S, Denissov D, Hoek S, et al. Partial discharge measurements in the ultra high frequency (UHF) range[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 2008, 15(6): 1544-1552.
5. Jennings E, Collinson A. A partial discharge monitor for the measurement of partial discharges in a high voltage plant by the transient earth voltage technique[C]// 1993 IEEE International Conference on Partial Discharge. Canterbury, New Zealand: IEEE, 1993: 90-91.
6. LI Yan-qing, LU Fang-cheng, XIE Hong-ling, et al. Study on ultrasonic generation mechanism of partial discharge[C]// IEEE Int. Symposium. Electrical Insulating Materials. Kitakyushu, Japan: IEEE, 2005: 467-471.
7. NIU Bo, SONG Zheng-xiang, GENG Ying-san, et al. A modeling method on electromagnetic interference coupling path of digital relay in power system[C]// 19th Int. Zurich Symposium. Electromagnetic Compatibility. Singapore: IEEE, 2008: 455-458.
8. WANG Yu-feng, ZOU Ji-yan, LIAO Min-fu. Coupling paths of EFT/B in switch cabinet and electromagnetic shielding[J]. Electric Power Automation Equipment, 2008, 28(8): 102-105.
9. LI Qing-quan, LI Yan-ming, NIU Ya-min, et al. The transient electromagnetic fields caused by the operation of disconnector in substation and protection[J]. High Voltage Engineering, 2001, 27(4): 65-67.
10. LIANG Zhen-guang. Coupling path analysis of electromagnetic disturbances in a substation[J]. High Voltage Engineering, 2008, 34(11): 2423-2427.
11. Neil DAVIES, Joe Cheung, Yin TANG, Paul SHIEL. Benefits and experiences of non-intrusive partial discharge measure ments on MV swithchgear[C]// CIRED 19th International Conference on Electricity Distribution. Vienna: IEEE, 2007.
12. ZHEN Zhong, TAN Ke-xiong, GAO Kai. Pulse shape characteristic analysis of partial discharge signals[J]. High Voltage Engineering, 1999, 25(4): 15-17.
13. SONG Xiao-di, ZHOU Cheng-ke, Hepburn D M. An algorithm for identifying the arrival time of PD pulses for PD source location[C]// IEEE Conference on Electrical Insulation and Dielectric Phenomena. Quebec City, Canada: [s.n.], 2008, 26/29: 31-34.
14. GUAN Yong-gang, QIAN Jia-li. Practical study of radio frequency signal used in on-line PD monitoring of HV switchboard[J]. High Voltage Apparatus, 2001, 37(5): 1-3.
15. Hong T, Fang M T C, Hilder D. PD classification by a modular neural network based on task decomposition[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 1996, 3(2): 207-212.
16. Bozar T, Borucki S, Cichon A, et al. Application possibilities of artificial neural networks for recognizing partial discharges measured by the acoustic emission method[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 2009, 16(1): 214-223.
17. ZHU Zhou-xia, QIU Yu-chang. Feature extraction of multi-defect partial discharge patterns[J]. High Voltage Engineering, 2002, 28(3): 14-15, 27.