-
1
-
-
33749510022
-
Flectrial fast transient burst immunity of protection equipment
-
LIANG Zhicheng, FU Jingbo, LI Futong. et al. Flectrial fast transient burst immunity of protection equipment [J]. Automation of Electric Power Systems, 2003, 27 (11): 65-68.
-
(2003)
Automation of Electric Power Systems
, vol.27
, Issue.11
, pp. 65-68
-
-
Liang, Z.1
Fu, J.2
Li, F.3
-
2
-
-
15044355584
-
Research on the susceptivity on microprocessor based protection equipment
-
XIAO Baoming, WANG Zezhong, LU binxian, et al. Research on the susceptivity on microprocessor based protection equipment [J]. Automation of Electric Power Systems, 2005, 29 (3): 61-64.
-
(2005)
Automation of Electric Power Systems
, vol.29
, Issue.3
, pp. 61-64
-
-
Xiao, B.1
Wang, Z.2
Lu, B.3
-
3
-
-
34548659469
-
Research on electrical fast transient/burst immunity for numerical protection
-
CHENG Lijun, DENG Huiqiong. Research on electrical fast transient/burst immunity for numerical protection [J]. Electric Power Automation Equipment, 2002, 22 (6): 5-8.
-
(2002)
Electric Power Automation Equipment
, vol.22
, Issue.6
, pp. 5-8
-
-
Cheng, L.1
Deng, H.2
-
4
-
-
50049118305
-
Influence of EFT on data acquisition system of numerical protection and its counter-measures
-
CHENG Lijun, LI Yiqun, JIAO Shaohua. Influence of EFT on data acquisition system of numerical protection and its counter-measures [J]. Electric Power Automation Equipment, 2004, 24 (1): 14-18.
-
(2004)
Electric Power Automation Equipment
, vol.24
, Issue.1
, pp. 14-18
-
-
Cheng, L.1
Li, Y.2
Jiao, S.3
-
5
-
-
34548632589
-
Nanosecond risetime high-voltage electrical fast transient/burst generator
-
WANG Yufeng, LI Liwei, ZOU Jiyan, et al. Nanosecond risetime high-voltage electrical fast transient/burst generator [J]. Automation of Electric Power Systems, 2006, 30 (22): 96-99.
-
(2006)
Automation of Electric Power Systems
, vol.30
, Issue.22
, pp. 96-99
-
-
Wang, Y.1
Li, L.2
Zou, J.3
-
6
-
-
34648825644
-
Study of EFT/B generated in primary circuit and initiative countermeasure
-
WANG Yufeng, ZOU Jiyan, LIAO Minfu. Study of EFT/B generated in primary circuit and initiative countermeasure [J]. Electric Power Automation Equipment, 2007, 27 (9): 22-26.
-
(2007)
Electric Power Automation Equipment
, vol.27
, Issue.9
, pp. 22-26
-
-
Wang, Y.1
Zou, J.2
Liao, M.3
-
7
-
-
34548610961
-
Study of EFT/B generated in secondary circuit and initiative countermeasure
-
WANG Yufeng, ZOU Jiyan. LIAO Minfu. Study of EFT/B generated in secondary circuit and initiative countermeasure [J]. Automation of Electric Power Systems, 2007, 31 (16): 79-82.
-
(2007)
Automation of Electric Power Systems
, vol.31
, Issue.16
, pp. 79-82
-
-
Wang, Y.1
Zou, J.2
Liao, M.3
-
8
-
-
50049117734
-
-
Chinese source
-
-
-
-
9
-
-
0035429042
-
The transient electromagnetic fields caused by the operation of disconnector
-
LI Qingquan, LI Yanming, NIU Yamin. The transient electromagnetic fields caused by the operation of disconnector [J]. High Voltage Engineering, 2001, 27 (4): 35-37.
-
(2001)
High Voltage Engineering
, vol.27
, Issue.4
, pp. 35-37
-
-
Li, Q.1
Li, Y.2
Niu, Y.3
-
11
-
-
34047201882
-
Analytical methods of electromagnetic susceptibility for electronic devices with shielded enclosure at system level
-
ZHANG Aimin, ZHANG Hang, CHEN Degui, et al. Analytical methods of electromagnetic susceptibility for electronic devices with shielded enclosure at system level [J]. Journal of Xi'an Jiaotong University, 2007, 41 (2): 190-194.
-
(2007)
Journal of Xi'an Jiaotong University
, vol.41
, Issue.2
, pp. 190-194
-
-
Zhang, A.1
Zhang, H.2
Chen, D.3
-
12
-
-
50049131804
-
-
Chinese source
-
-
-
-
13
-
-
50049085813
-
-
Chinese source
-
-
-
-
14
-
-
50049090870
-
-
Chinese source
-
-
-
-
15
-
-
50049094491
-
-
Chinese source
-
-
-
|