Thickness and substrate orientation dependence of ferromagnetism in Mn doped ZnO thin films

Crystal Research and Technology

Volumn 47, Issue 1, 2012, Pages 45-52

  Gopalakrishnan, N ^a   Balakrishnan, L ^a   Brindha, A ^a   Jayalakshmi, G ^a  

^a NATIONAL INSTITUTE OF TECHNOLOGY   (India)

Author keywords

dilute magnetic semiconductor; Mn doped ZnO; substrate orientation effect; thickness effect

Indexed keywords

DIFFERENT THICKNESS; DILUTE MAGNETIC SEMICONDUCTORS; HALL EFFECT MEASUREMENT; HALL MEASUREMENTS; HEXAGONAL WURTZITE STRUCTURE; HIGH DENSITY; HIGH QUALITY; MN ATOMS; MN DOPED ZNO; ROOM TEMPERATURE; SI(1 0 0); SI(111) SUBSTRATE; SUBSTRATE ORIENTATION; SUBSTRATE ORIENTATION EFFECT; THICKNESS EFFECT; VIBRATING SAMPLE MAGNETOMETER; XRD; XRD ANALYSIS;

ELECTRIC PROPERTIES; ENERGY DISPERSIVE SPECTROSCOPY; FERROMAGNETISM; HALL EFFECT; MAGNETIC PROPERTIES; MAGNETIC SEMICONDUCTORS; MANGANESE; METALLIC FILMS; OPTICAL FILMS; SATURATION MAGNETIZATION; SILICON; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE; ZINC SULFIDE;

SUBSTRATES;

EID: 83455244914     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.201100425     Document Type: Article

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