Evaluation of a Compton scattering camera using 3-D position sensitive CdZnTe detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3768, Issue , 1999, Pages 228-238

  Du, Y F ^a   He, Z ^a   Knoll, G F ^a   Wehe, D K ^a   Li, W ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POWER MEASUREMENT; MONTE CARLO METHODS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR DEVICES;

CADMIUM ZINC TELLURIDE; COMPTON SCATTERING CAMERAS; SEMICONDUCTOR DETECTORS;

RADIATION DETECTORS;

EID: 0033336906     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.366587     Document Type: Conference Paper

References (8)