The effects of Co60 gamma radiation on electron multiplying charge-coupled devices

IEEE Transactions on Nuclear Science

Volumn 51, Issue 5 III, 2004, Pages 2747-2752

  Hadwen, Benjamin J ^a   Camas, Mercedes Alcon ^a   Robbins, Mark S ^a  

^a E2V TECHNOLOGIES   (United Kingdom)

Author keywords

Charge coupled device; Electron multiplying charge coupled device (EMCCD); Image sensors; Impact ionization; Low light; Radiation effects

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRONS; GAMMA RAYS; IMAGE SENSORS; IMPACT IONIZATION; IONIZATION; RADIATION EFFECTS; THERMAL EFFECTS; THRESHOLD VOLTAGE;

ELECTRON MULTIPLYING CHARGE COUPLED DEVICES (EMCCD); LOW LIGHT; MULTIPLICATION GAIN;

COBALT;

EID: 8344272941     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.835099     Document Type: Article

References (8)

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