Application of positron annihilation techniques for semiconductor studies

Journal of Alloys and Compounds

Volumn 382, Issue 1-2, 2004, Pages 244-251

  Karwasz, G P ^a   Zecca, A ^a   Brusa, R S ^a   Pliszka, D ^b  

^a UNIVERSITY OF TRENTO   (Italy)

^b POMERANIAN UNIVERSITY IN S UPSK   (Poland)

Author keywords

Helium; Implantation; Point defects; Positron annihilation; Positron spectroscopies; Precipitation; Semiconductors; Silicon

Indexed keywords

HELIUM; ION IMPLANTATION; MAGNETIC FIELD EFFECTS; POINT DEFECTS; POSITRON ANNIHILATION SPECTROSCOPY; PRECIPITATION (CHEMICAL); SILICON;

ANGULAR CORRELATION OF ANNIHILATION RADIATION (ACAR); POSITRON ANNIHILATION; POSITRON SPECTROSCOPIES; SOLID STATE SPECTROSCOPY;

SEMICONDUCTOR MATERIALS;

EID: 8344257979     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.05.037     Document Type: Conference Paper

References (20)

1. R. Krause-Rehberg, H.S. Leipner, Positron Annihilation in Semiconductors - Defect Studies, Springer Series in Solid-State Sciences 127, Springer-Verlag, Berlin, 1999.
2. A. Zecca, G. Karwasz, Physics World, November 2001, pp. 21.
3. Anderson C.D. Science. 76:1932;238.
4. DuMond J.W.M., Lind D.A., Watson B.B. Phys. Rev. 75:1949;1226.
5. DeBenedetti S., Cowan C.E., Konneker W.R. Phys. Rev. 76:1949;440.
6. Biasini M., Ferro G., Kontrym-Sznajd G., Czopnik A. Phys. Rev. B. 66:2002;075126.
7. Brusa R.S., Deng W., Karwasz G.P., Zecca A. Nuclear Instr. Meth. Phys. Res. B. 194:2002;519.
8. Deng W., Pliszka D., Brusa R.S., Karwasz G.P., Zecca A. Acta Phys. Pol. A. 101:2002;875.
9. Puska M.J., Nieminen R. Rev. Mod. Phys. 66:1994;481.
10. Hakala M., Puska M.J., Nieminen R. Phys. Rev. B. 57:1998;7621.
11. Asoka-Kumar P., Lynn K.G., Welch D.O. J. Appl. Phys. 76:1994;4935.
12. Zecca A., Bettonte M., Paridaens J., Karwasz G.P., Brusa R.S. Meas. Sci. Technol. 9:1998;409.
13. Zecca A., Brusa R.S., Duarte-Naia M.P., Karwasz G.P., Paridaens J., Piazza A., Kögel G., Sperr P., Britton D.T., Uhlmann K., Willutzki P., Triftshäuser W. Europhys. Lett. 29:1995;617-622.
14. Brusa R.S., Karwasz G.P., Tiengo N., Zecca A., Corni F., Tonini R., Ottaviani G. Phys. Rev. B. 61:2000;10154.
15. Brusa R.S., Deng W., Karwasz G.P., Zecca A., Pliszka D. Appl. Phys. Lett. 79:2001;1492.
16. Borghesi A., Pivac B., Sasella A., Stella A. J. Appl. Phys. 77:1995;4169.
17. Kusz B., Pliszka D., Gazda M., Brusa R.S., Trzebiatowski K., Karwasz G.P., Murawski L. J. Appl. Phys. 94:2003;7270.
18. Pliszka D., Gazda M., Kusz B., Trzebiatowski K., Karwasz G.P., Deng W., Brusa R.S., Zecca A. Acta Phys. Pol. 99:2001;465.
19. Brusa R.S., Spagolla M., Karwasz G.P., Zecca A., Ottaviani G., Corni F., Carollo E. J. Appl. Phys. 95:2004;2348.
20. Rubaszek A., Szotek Z., Temmerman W.M. Phys. Rev. B. 58:1998;11285.