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Journal of Applied Physics

Volumn 94, Issue 11, 2003, Pages 7270-7275

Structural studies of bismuth nanocrystals embedded in SiO2 or GeO2 matrices

(8) Kusz, B a Pliszka, D b Gazda, M a Brusa, R S c Trzebiatowski, K a Karwasz, G P c Zecca, A c Murawski, L a

a GDANSK UNIVERSITY OF TECHNOLOGY (Poland)

b POMERANIAN UNIVERSITY IN S UPSK (Poland)

c UNIVERSITY OF TRENTO (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; BISMUTH; CRYSTAL STRUCTURE; GERMANIUM COMPOUNDS; GLASS; HEAT TREATMENT; HYDROGEN; OPTICAL MICROSCOPY; REDUCTION; SILICA;

ISOTHERMAL ANNEALING; SURFACE CONDUCTIVITY;

NANOSTRUCTURED MATERIALS;

EID: 0346331508 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1624484 Document Type: Article

Times cited : (8)

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