Application of a mesh experiment for a proton beam onto the charge-coupled device

IEEE Transactions on Nuclear Science

Volumn 51, Issue 5 I, 2004, Pages 2288-2292

  Tsunemi, Hiroshi ^a   Miki, Masami ^a   Miyata, Emi ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Charge coupled devices; Charge transfer; Ion implementation; Proton beams; Proton radiation effects; Radiation hardening; X ray astronomy detectors

Indexed keywords

CAMERAS; CARRIER CONCENTRATION; HIGH ENERGY PHYSICS; IMAGING TECHNIQUES; IRRADIATION; OPTICAL IMAGE STORAGE; PHOTONS; PROBABILITY; PROTON BEAMS; RADIATION HARDENING; SATELLITES; X RAYS;

CHARGE TRANSFER (CT); ION IMPLEMENTATION; PROTON RADIATION EFFECTS; X-RAY ASTRONOMY DETECTORS;

CHARGE COUPLED DEVICES;

EID: 8344224618     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.835571     Document Type: Article

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