메뉴 건너뛰기




Volumn 46, Issue 1, 2012, Pages 77-82

Monitoring sandwich structured SiC ceramics integrity with electrical resistance

Author keywords

Electrical resistance monitoring; Porous ceramics; Sandwich structures; Silicon carbide

Indexed keywords

ELECTRICAL RESISTANCES; FOUR POINT BENDING; HIGH TEMPERATURE; POROUS CERAMICS; SENSING TECHNIQUES; SIC CERAMICS; STRUCTURE INTEGRITY; THERMAL PROTECTION SYSTEM;

EID: 83155185541     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ndteint.2011.11.007     Document Type: Article
Times cited : (11)

References (29)
  • 17
    • 84891570166 scopus 로고    scopus 로고
    • Wikipedia contributors Wikipedia, The Free Encyclopedia, 30 June 2011, Web. 8 July
    • Wikipedia contributors. Silicon carbide. Wikipedia, The Free Encyclopedia, 30 June 2011, Web. 8 July, 2011.
    • (2011) Silicon Carbide
  • 22
    • 84855606177 scopus 로고    scopus 로고
    • EP 0907621
    • J Adler, et al., EP 0907621, 1996.
    • (1996)
    • Adler, J.1
  • 23
    • 84890973409 scopus 로고    scopus 로고
    • Electrical properties
    • M. Scheffler, P. Colombo, Wiley-VCH Weinheim
    • H.P. Martin, and J. Adler Electrical properties M. Scheffler, P. Colombo, Cellular Ceramics 2005 Wiley-VCH Weinheim 361 380
    • (2005) Cellular Ceramics , pp. 361-380
    • Martin, H.P.1    Adler, J.2
  • 27
    • 84855606180 scopus 로고    scopus 로고
    • Cf/SiCm CMC - SiC foam sandwich preparation and characterization
    • W. Krenkel, J. Lamon, editors Bayreuth
    • Ortona A, Pusterla S, Gianella S, Cf/SiCm CMC - SiC foam sandwich preparation and characterization. In: W. Krenkel, J. Lamon, editors, High temperature ceramic materials and composites, Bayreuth, 2010, pp. 694705.
    • (2010) High Temperature Ceramic Materials and Composites , pp. 694705
    • Ortona, A.1    Pusterla, S.2    Gianella, S.3
  • 28
    • 79952424447 scopus 로고    scopus 로고
    • Reticulated SiC foam X-ray CT, meshing, and simulation advances
    • R. Narayan, P. Colombo, S. Mathur, T. Ohji, John Wiley & Sons, Inc. Hoboken
    • A. Ortona, S. Pusterla, and S. Valton Reticulated SiC foam X-ray CT, meshing, and simulation advances R. Narayan, P. Colombo, S. Mathur, T. Ohji, Bioceramics and Porous Ceramics III Ceramic Engineering and Science Proceedings 31 2011 John Wiley & Sons, Inc. Hoboken 93 104
    • (2011) Bioceramics and Porous Ceramics III Ceramic Engineering and Science Proceedings , vol.31 , pp. 93-104
    • Ortona, A.1    Pusterla, S.2    Valton, S.3
  • 29
    • 84855613730 scopus 로고    scopus 로고
    • AltairTroy, Michigan, U.S.A.
    • AltairTroy, Michigan, U.S.A.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.