Structural health monitoring by electrical resistance measurement

Smart Materials and Structures

Volumn 10, Issue 4, 2001, Pages 624-636

  Chung, D D L ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC INSULATION TESTING; ELECTRIC RESISTANCE MEASUREMENT; INTELLIGENT STRUCTURES; JOINTS (STRUCTURAL COMPONENTS); NONDESTRUCTIVE EXAMINATION; STRUCTURAL LOADS;

STRUCTURAL HEALTH MONITORING;

STRUCTURAL ANALYSIS;

EID: 0035417516     PISSN: 09641726     EISSN: None     Source Type: Journal    
DOI: 10.1088/0964-1726/10/4/305     Document Type: Review

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