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Volumn , Issue , 2011, Pages 345-350

Skin and proximity effects modeling in micro-wires based on carbon nanotube bundles

Author keywords

effective impedance; nanotube bundle; signal integrity; skin and proximity effects; transmission line

Indexed keywords

EFFECTIVE IMPEDANCE; NANOTUBE BUNDLE; PROXIMITY EFFECTS; SIGNAL INTEGRITY; TRANSMISSION LINE;

EID: 83155163909     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (10)
  • 1
    • 70350183749 scopus 로고    scopus 로고
    • High-frequency analysis of carbon nanotube interconnects and implications for on-chip inductor design
    • October
    • H. Li, K. Banerjee, "High-frequency analysis of carbon nanotube interconnects and implications for on-chip inductor design", IEEE Transactions on Electron Devices, Vol. 56, No. 10, October 2009, pp. 2202-2214.
    • (2009) IEEE Transactions on Electron Devices , vol.56 , Issue.10 , pp. 2202-2214
    • Li, H.1    Banerjee, K.2
  • 2
    • 62449245505 scopus 로고    scopus 로고
    • New electron-waveguide-based modeling for carbon nanotube interconnects
    • Mar.
    • M.S.Sarto, A. Tamburrano, M.D'Amore, "New electron-waveguide-based modeling for carbon nanotube interconnects", IEEE Trans. on Nanotechnol., Vol. 8, No. 2, Mar. 2009, pp.214-225.
    • (2009) IEEE Trans. on Nanotechnol. , vol.8 , Issue.2 , pp. 214-225
    • Sarto, M.S.1    Tamburrano, A.2    D'Amore, M.3
  • 3
    • 77952742241 scopus 로고    scopus 로고
    • Fast transient analysis of next generation interconnect based on carbon nanotubes
    • May
    • M.D'Amore, M.S.Sarto, A. Tamburrano, "Fast transient analysis of next generation interconnect based on carbon nanotubes", IEEE Trans. on Electromagnetic Compatibility, Vol. 53, No. 2, May 2010, pp.496-503.
    • (2010) IEEE Trans. on Electromagnetic Compatibility , vol.53 , Issue.2 , pp. 496-503
    • D'Amore, M.1    Sarto, M.S.2    Tamburrano, A.3
  • 9
    • 33947642463 scopus 로고    scopus 로고
    • Evaluating the impact of resistance in carbon nanotube bundles for VLSI interconnect using diameterdependent modeling techniques
    • Oct.
    • A. Nieuwoudt, Y. Massoud, "Evaluating the impact of resistance in carbon nanotube bundles for VLSI interconnect using diameterdependent modeling techniques", IEEE Trans. Electron Devices, Vol. 53, No. 10, Oct. 2006, pp. 2460-2466.
    • (2006) IEEE Trans. Electron Devices , vol.53 , Issue.10 , pp. 2460-2466
    • Nieuwoudt, A.1    Massoud, Y.2
  • 10
    • 0001038774 scopus 로고
    • Exact inductance equations for rectangular conductors with applications to more complicated geometries
    • C. Hoer, C. Love, "Exact inductance equations for rectangular conductors with applications to more complicated geometries", J. Research National Bureau of Standards-C. Engineering Instrumentation, Vol. 69, No. C, 1965, pp. 127-137.
    • (1965) J. Research National Bureau of Standards-C. Engineering Instrumentation , vol.69 , Issue.100 , pp. 127-137
    • Hoer, C.1    Love, C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.