Calibrated bayes, for statistics in general, and missing data in particular

Statistical Science

Volumn 26, Issue 2, 2011, Pages 162-174

  Little, Roderick ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Maximum likelihood; Multiple imputation; Penalized splines; Propensity models; Sequential regression multivariate imputation

Indexed keywords

EID: 83055193550     PISSN: 08834237     EISSN: None     Source Type: Journal    
DOI: 10.1214/10-STS318     Document Type: Article

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