Multiple imputation for model checking: Completed-data plots with missing and latent data

Biometrics

Volumn 61, Issue 1, 2005, Pages 74-85

  Gelman, Andrew ^a   Van Mechelen, Iven ^b   Verbeke, Geert ^b   Heitjan, Daniel F ^c   Meulders, Michel ^b  

^a Columbia University ^*  (United States)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

Bayesian model checking; Exploratory data analysis; Multiple imputation; Nonresponse; Posterior predictive checks; Realized discrepancies; Residuals

Indexed keywords

BAYESIAN NETWORKS;

BAYESIAN MODEL CHECKING; BAYESIAN MODELLING; EXPLORATORY DATA ANALYSIS; MODELS CHECKING; MULTIPLE IMPUTATION; NONRESPONSE; OBSERVED DATA; POSTERIOR PREDICTIVE CHECK; REALIZED DISCREPANCY; RESIDUAL;

MODEL CHECKING;

BAYESIAN ANALYSIS; DATA SET; ERROR ANALYSIS;

ARTICLE; BAYES THEOREM; DATA ANALYSIS; DIAGNOSTIC PROCEDURE; INFORMATION PROCESSING; MATHEMATICAL MODEL; PREDICTION; QUALITATIVE ANALYSIS; STATISTICAL ANALYSIS;

EID: 15044358532     PISSN: 0006341X     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0006-341X.2005.031010.x     Document Type: Article

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