X-ray radiation effect on CMOS imagers with in-pixel buried-channel source follower

European Solid-State Device Research Conference

Volumn , Issue , 2011, Pages 155-158

  Chen, Yue ^a   Tan, Jiaming ^a   Wang, Xinyang ^b   Mierop, Adri J ^c   Theuwissen, Albert J P ^a,d  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b CMOSIS NV   (Belgium)

^c DALSA BV   (Netherlands)

^d Harvest Imaging   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE PIXEL; BURIED CHANNELS; CMOS IMAGE SENSOR; CMOS IMAGERS; DYNAMIC RANGE; IMAGING APPLICATIONS; INTERFACE TRAPS; OUTPUT SWING; PIXEL STRUCTURE; RANDOM NOISE; RANDOM TELEGRAPH SIGNAL NOISE; SOURCE FOLLOWERS; X RAY RADIATION;

ACOUSTIC NOISE MEASUREMENT; CMOS INTEGRATED CIRCUITS; DIGITAL CAMERAS; IMAGE SENSORS; MEDICAL IMAGING; OPTIMIZATION; SENSORS; TELEGRAPH; X RAY PRODUCTION;

PIXELS;

EID: 82955195022     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2011.6044211     Document Type: Conference Paper

References (8)

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